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Cameca SX-100 Instrumentation

This should be useful to those of you who want to include a description of the probe in papers or proposals.

The Cameca SX-100 microprobe at New Mexico Tech is equipped with 3 wavelength dispersive (WD) spectrometers, plus secondary electron and high-speed backscattered electron detectors. Soon to be added is an Amptek solid state X-ray detector that will allow quick identification of phase composition both on smooth and rough sample surfaces. The Cameca is controlled by a SPARC-5 workstation, and is internet-connected for efficient data and image transfer. The WD spectrometers are each outfitted with multiple analyzing crystals, two in each spectrometer. One spectrometer equipped with extra-large crystals and a high-pressure detector that produce count rates up to 4 times higher than the standard crystals, allowing more precise analysis of elements present in low abundances. Crystals include two standard TAP, a large and small LIF, and a large and small PET.  The WDS spectrometers can be used to conduct quantitative analyses on individually selected points, traverses, and point grids. High resolution backscattered, secondary electron, and x-ray map images can be acquired with the probe and further processed to improve image quality.  These images can be transferred electronically from the SPARC-5 workstation to user's computers for further image processing, incorporation into papers, or to be output in slide format.

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Revised: 12 November, 2008

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